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Low-temperature Scanning Probe Microscopy
Our research group focusses on high-resolution scanning probe microscopy at low temperatures. A combined scanning tunnelling and atomic force microscope (financed by the German Research Foundation, DFG) has been delivered in summer 2017 and is installed at the Department of Physics at the University of Osnabrück. We typically operate the instrument at 77K using liquid nitrogen or at 5K using liquid helium from the liquefier installed at the department.
With the instrument we investigate conducting samples (such as silicon or metals) using the tunnelling current as feedback signal in scanning tunnelling microscopy (STM) as well as insulating materials (such as salt, calcite or calcium fluoride) using the force interaction between an ultrasharp tip and the sample in non-contact atomic force microscopy (NC-AFM). In all modes we achieve atomic resolution.
